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Technical Papers

Technical library
Our series of Technical papers
The new series of Technical Papers are designed to provide insights and best practices for engineers and all those with an interest in EMC compliance and power amplifiers. Feel free to contact us If you have any questions relating to the topics discussed or if you need assistance selecting the right solution for your application. 
  • An Introduction to EMC testing on electric vehicles +



     Introduction_to EMC Testing on Electric Vehicles AN INTRODUCTION TO EMC TESTING ON ELECTRIC VEHICLES
    Author: Thomas Handschin 
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    This Technical Note summarizes the recent changes to the standards that affect Burst and Surge testing. These include pulse shape, calibration/verification and even specification of coupling networks that could lead to different test results. This information is a summary of the most important changes and the possible influence in test results.
  • Amplifier Selection - What you need to know +



     Amplifier selection guide - what you need to know AMPLIFIER SELECTION | WHAT YOU NEED TO KNOW
    Author: Nick Jones
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    This Technical Note is a guide to the important points to consider when selecting an amplifier, ensuring the product meets the application requirements for EMC, Communications, Aerospace and Defence.
  • Voltage Offset Test - Application Note +



     Voltage offset test VOLTAGE OFFSET TEST
    AuthorThomas Handschin 
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    International and manufacturer standards define a set of EMC tests that must be performed on high voltage components of electric cars. Two different test methods are used to perform the voltage offset test, which are described in this application note.
  • Managing stability and spurious signals in RF and Microwave Amplifiers +



     Stability and spurious signals in RF and Microwave Amplifiers MANAGING STABILITY AND SPURIOUS SIGNALS IN RF AND MICROWAVE AMPLIFIERS
    AuthorDr. Dominic FitzPatrick
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    Whatever the application, accurate results that can be consistently repeated is a reasonable expectation for any engineer using an RF or Microwave Amplifier. This technical note draws on this experience, and provides actionable insights that will help users identify and manage external factors that may negatively affect performance and results.
  • TWT Amplifier Fitness Plan +



     TWT Amplifier Fitness Plan TWT AMPLIFIER - FITNESS PLAN
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    The TWT Amplifier Fitness Plan has been engineered to help users get consistent long-term performance from their instrument. Following this plan will ensure you provide the greatest protection for the specialized components contained in a TWT design.
  • Dropout Testing - are you doing it wrong? +



     Dropout testing DROPOUT TESTING “ARE YOU DOING IT WRONG?”
    Author: Tim Horacek
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    Different test setups and confusion about the intent of the standard can result in different results and behavior of the device under test during the simulation. We created this document
    to help test engineers understand the different accepted methods of performing the testing and eliminate errors that can occur while performing drop-out testing.
  • Radar Pulse Testing - what are you options? +



     Radar pulse test RADAR PULSE TESTING WHAT ARE YOUR OPTIONS?
    Author: Nick Jones
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    Many establishments use radar systems designed to scan at ground level. This is used at airports to control aircraft during taxi and take off. Such systems are also used for security at airports and military establishments. This represents a severe threat to a vehicle when the high fields impact on safety critical electronic components for example; air-bags, ABS, collision avoidance systems. This document
    will help test engineers understand the different accepted methods of performing radar pulse testing.
  • Summary of changes to the Burst and Surge standard +



     Changes in Burst and Surge standard BURST AND SURGE - SUMMARY OF CHANGES TO THE STANDARD
    Author: Frank Niechcial 
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    This Technical Note summarises the recent changes to the standards that affect Burst and Surge testing. These include pulse shape, calibration/verification and even specification of coupling networks that could lead to different test results. This information is a summary of the most important changes and the possible influence in test results.
  • Burst waveform verification for Transient Generators +



     Burst Waveform Verification for Transient Generators BURST WAVEFORM VERIFICATION FOR TRANSIENT GENERATORS

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    Electrical fast transients (EFT) or burst testing attempts to imitate the natural phenomenon of what occurs when a switch opens or closes a circuit. The repetitive fast transient test consists of a number of fast transients, coupled into power and control/signal ports of electrical and electronic  equipment.
  • Surge waveform verification for Transient Generators +



     Surge_Waveform Verification for Transient Generators SURGE WAVEFORM VERIFICATION FOR TRANSIENT GENERATORS

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    Surge is caused by over-voltages from switching and lightning transients. IEC 61000-4-5 describes several tests which are intended to evaluate immunity from several natural phenomena and various equipment configurations.