Electrical and electronic products
Testing solutions for international standards
AMETEK CTS offers solutions for the widest range of international standards. The portfolio of products has the capability to simulate electrical fast transients / Bursts, damped oscillatory waves, magnetic fields, electrostatic discharge and much more, they also can be delivered with an accredited calibration according to ISO 17025. To complete the solution we offer various coupling networks for high power AC- and DC-applications.
IEC immunity pulses
Electrical fast transients / Burst
High energy surge transients
Ringwaves from switching in substations
Damped oscillatory waves
Telecom surge transients
Dips and interruptions
Magnetic field testing
Transient insulating testing
ISO 17025 accredited calibration
ESD guns and accessories
ISO 10605
IEC 61000-4-2
Over 80 R/C networks
Targets, tips and accessories
ISO 17025 accredited calibration
Software automation
Robotic-compatible simulators
EMC immunity and compliance to international standards
AMETEK CTS has been providing EMC compliance solutions to many of the worlds biggest brands, providing them with confidence that their products meet the changing requirements demanded by standards.
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ANSI/IEEE C37.90
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EN 50121
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EN 61000-4-17
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GMW 3097 (2006)
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IEC 60335-1
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IEC 61000-4-8
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ANSI/IEEE C62.41
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EN 50121-3-2
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EN 61000-4-18
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GOST 28751-90
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IEC 60533
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IEC 61000-4-9
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Bellcore GR-1089-Core
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EN 50121-4
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EN 61000-4-2
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IEC/EN 61000-4-10
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IEC 60601-1-2
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IEC 61008-1
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CISPR 15
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EN 50121-5
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EN 61000-4-27
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IEC/EN 61000-4-11
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IEC 60664-1
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IEC 61009-1
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CISPR 16-1
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EN 50155
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EN 61000-4-28
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IEC/EN 61000-4-13
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IEC 60725
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IEC 61180
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DEF STAN 61-5, Part 6
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EN 55015
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EN 61000-4-29
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IEC/EN 61000-4-14
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IEC 60747-5
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IEC 61180-1
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Det Norske Veritas (DNV)
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EN 55024
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EN 61000-4-34
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IEC/EN 61000-4-17
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IEC 60945
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IEC 61180-2
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DIN 72300-2
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EN 60065
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EN 61000-4-4
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IEC/EN 61000-4-27
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IEC 60950-1
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IEC 61326
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DO 160 Section 16
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EN 60255-27
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EN 61000-4-5
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IEC/EN 61000-4-28
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IEC 61000-4-10
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IEC 61543
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DO 160 Section 18
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EN 60255-5
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EN 61000-4-6
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IEC/EN 61000-4-29
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IEC 61000-4-11
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IEC 61730-1
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DO 160 Section 20
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EN 60335-1
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EN 61000-4-7
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IEC 384-14
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IEC 61000-4-12
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IEC 61730-2
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EN 300329
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EN 60945
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EN 61000-4-8
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IEC 60060
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IEC 61000-4-16
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IEC 61850-3
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EN 300340
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EN 60950-1
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EN 61000-4-9
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IEC 60060-1
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IEC 61000-4-18
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IEC 61851-21
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EN 300342-1
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EN 61000-4-10
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EN 61000-6-1
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IEC 60065
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IEC 61000-4-19, Annex C
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IEC 62052-11
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EN 300386-2
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EN 61000-4-11
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EN 61000-6-2
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IEC 60255-22-1
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IEC 61000-4-2
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IEC 62475
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EN 300386 V1.3.2
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EN 61000-4-12
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EN 61543
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IEC 60255-22-5
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IEC 61000-4-29
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IEC 62477-1
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EN 301489-1
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EN 61000-4-13
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EN 61730-1
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IEC 60255-22-7
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IEC 61000-4-34
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IEEE 1547
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EN 301489-17
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EN 61000-4-14
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EN 61730-2
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IEC 60255-26
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IEC 61000-4-4
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ITU-T K.12
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EN 301489-24
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EN 61000-4-15
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FCC 97-270 (part 68)
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IEC 60255-27
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IEC 61000-4-5
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IEC 61000-4-8
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EN 301489-7
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EN 61000-4-16
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GLloyd VI-7-2
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IEC 60255-5
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IEC 61000-4-6
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IEC 61000-4-9
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Our products
We have a broad range of solution covering the immunity requirements for conducted and radiated phenomenon.
You can see the available solutions from AMETEK CTS at emtest.com and teseq.com