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Product Groups

Automotive Electrical Disturbances
- Transient Immunity
  - RCB 200N1
  - NSG 5071
  - JT 5550
  - JT 5510
  - MT 5511
  - LD 5550
  - FLX 5510
  - NSG 5500
  - UCS 200N Family
  - LD 200N series
- Transient Emissions
  - AES 5501
  - Transient Emission Set
- Automotive Electrical Disturbances Accessories
  - ACC
  - CA BS 200N
  - CA ISO
  - CDN 500
Automotive Supply Voltage Variations
- Ripple Generators and Couplers
- Dips and Interrupts Generators and Modules
- LV 124 and LV 148 Systems and Components
- Arbitrary Waveform Generators
  - AutoWave
  - ARB 5500
- Accessories
  - CA LV124/LV148 Series
Automotive Battery Simulators
- Four-Quadrant Battery Simulators
  - VDS 200Q Series
  - PA 5840 & PA 5740 Family
- One- and Three-Quadrant Battery Simulators
  - VDS 200R Series
  - RDS 200N1
Electrostatic Discharge ESD
- 16.5 kV
  - NSG 435
  - dito
- 30 kV
- Accessories
  - MD 102A
  - CTR 2
Harmonics & Flicker
- Analyzers
- Power Sources
- Flicker Impedances
  - DPA 503N & AIF 503N
Programmable AC/DC Power Sources
- Single Phase
- Three Phase
- Options & Accessories
  - C-BOX 10/100-1000
  - SPN 3-690-200
Dips, Interrupts & Variations
- Power Fail Simulators
  - PFS 503Nx.2 Series
  - PFS 503N Series
- Stepped Transformers
- Motor Variacs
Ring Wave / Damped Oscillatory
- Ringwave Generator
- Damped Oscillatory Wave
  - OCS 500N6 series
  - OCS 500N6F series
- Coupling Networks
  - CNV 504N5.1
  - CNV 508N4
Transient Generators (Surge, Burst)
- Compact Generator 5 kV
  - compact NX5 series
  - NSG 3040A models
- Compact Generator 7 kV
  - compact NX7 series
  - NSG 3060A models
- Burst Generator
- Surge Generator
- Telecom Surge
- Voltage Surge (1.2/50 us)
- Current Surge (8/20 us)
  - CSS 500N2 series
- Coupling Networks - Data Lines
- Coupling Networks - Power Lines
- Transient Accessories
Magnetic Fields
- Magnetic Fields for Automotive Applications
  - AMP 200N
- Field Generator
- Magnetic Field Antennas
Amplifiers - Solid State
- < 1 GHz
- < 6 GHz - Single Band
- < 6GHz - Dual Band
Amplifiers - CW TWT
- < 4 GHz
  - TWT2G4G Series
- < 8 GHz
  - TWT2G7G Series
  - TWT4G8G Series
- < 12 GHz
  - TWT6G12G Series
  - TWT8G12G Series
- < 18 GHz
  - TWT6G18G Series
  - TWT8G18G Series
Amplifiers - Pulsed TWT
- < 4 GHz
  - PTWT2G4G Series
- < 8 GHz
  - PTWT4G8G Series
- < 12 GHz
  - PTWT8G12G Series
- < 18 GHz
Amplifiers - Millimeter TWT Amplifiers
- < 26 GHz
  - TWT18G26G Series
- < 40 GHz
  - TWT26G40G Series
RF Immunity Test Systems
- High Frequency Generators
- Low Frequency Generators
  - CWS 500N3
  - NSG 4060B1
- Broadband Noise Generators
  - NSG 4031A
- Software
  - icd.control
  - CIS
RF Coupling Networks/ LISN
- CDN| EM TEST | Teseq
- CDND
- CDNE
- CN
- CT
  - CT 419-5
- LISN or AMN
- ISN or AAN
RF Probes and Clamps
- Absorbing Clamps / Ferrite Tubes
  - MBT 2 ( f.MDS21)
  - FT 801
  - CAL CMAD20A
  - CMAD 10
  - CAL KEMZ
  - CMAD 20B
  - MDS 21B
  - KEMA 801B
- EM Clamps
- Current Injection Probes
  - CIP 9136A
  - PCJ 9201B
  - PCJ 9202
  - CIP 9138
- Current Sensing Probes
  - MD 4070
  - CSP 9160A
- Capacitive Voltage Probe
  - CVP 2200A
RF System Components and Accessories
- Power Amplifiers
- Preamplifiers
  - LNA 6901
  - LNA 6900
- Power Meters
  - PMR 6006
  - PMR 6003
- RF Switches
- Attenuators
  - ATN 6 Series
- Directional Couplers
  - DCP 0100B
- Reference Sources
- Cables / Kits
  - BAL 4070
  - BTP 6020
  - CAS BAL4070
  - CTP 6099
  - ITF
  - LE 4031
  - RAD 6000
- Software
  - icd.control
  - CIS
GTEM / TEM Cells / Striplines / Reverberation Chambers
- GTEM Cells
  - GTEM 250
  - GTEM 1000
  - GTEM 1250
  - GTEM 1500
  - GTEM 1750
  - GTEM 2000
  - GTEM 500
  - GTEM 750
  - MPH
  - MPC
- Predefined GTEM Systems
  - GTEM Immunity Test Systems
- TEM Cells
  - D-TEM
- Reverberation Chambers / Stirrers
- Striplines
  - SL 50
  - SL 150
  - TPL 3000
  - SL 90
Antennas
- Bilog
  - CBL 6141B
  - CBL 6143A
  - CBL 6111D
  - CBL 6112D
  - BTP 6020
- Horn
  - TEM Horn
  - TEM Probe
- Loop
  - HLA 6121
  - CTP 6099
  - LAS 6100
  - LAS 6120

Dips and Interrupts Generators and Modules

Automotive Supply Voltage Variations | EM Test | Teseq

Some standards are written so that a fast semiconductor switch must be used to achieve the fast rise and fall times, or define very low, or very high-impedance open circuit simulations not possible with battery simulators (link to that) directly.

+DS Option

This dropout switch in the NSG 5500 +ARB +DS has been totally reengineered from the ground up for clean, symmetrical switching on all three switches: BAT+, BAT- and a new short-circuit (S2) switch for European requirements like LV 124
Keep Reading
PFS 200N Series

PFS 200N - Automotive Power Fail Simulator For Voltage Dips and Interruptions
Keep Reading
PFM 200N Series

Power Fail Module and dropout switch for LV 124/LV 148.
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