Transient Pulse Immunity

IEC 61000-4-2 ESD
This test is for electrical and electronic equipment subjected to electrostatic discharge (ESD) from operators/personnel directly touching equipment or being adjacent to the equipment.
 

AMETEK CTS solutions 

EM TEST	dito ESD NX30
Teseq	NSG 435 NSG 437 / 8

IEC 61000-4-4  EFT/Burst
The repetitive fast transient is a test with bursts consisting of a number of fast transients, coupled into power, control, signal and earth ports of electrical and electronic equipment. Significant for the test are the high amplitude, the short rise time, the high repetition frequency, and the low energy of the transients. 

The Burst test is intended to demonstrate the immunity of electrical and electronic equipment when subjected to transient disturbances such as those originating from switching transients (interruption of inductive loads, relay contact bounce, etc.).
 

AMETEK CTS solutions 

EM TEST	compact NX5 compact NX7 burst NX8
Teseq	NSG 3040A NSG 3060A

IEC 61000-4-5   Surge

This test is for electrical and electronic equipment subjected with regard to unidirectional surge caused by overvoltages from switching and lightning transients. A surge is a momentary, very high-energy pulse, which the device must survive unscathed. The standard distinguishes between power lines.

Power system switching transients:  Power system switching transients can be separated into transients associated with: 

• Major power system switching disturbances, such as capacitor bank switching.
• Minor local switching activity or load changes in the power distribution system. 
• Resonating circuits associated with switching devices, such as thyristors.
• Various system faults, such as short circuits and arcing faults to the grounding system of the installation. 
  
  

Lightning transients: The major mechanisms by which lightning produces surge voltages are the following: 

• Direct lightning strokes to outdoor circuits injecting high currents and producing over voltages. 
• Indirect lightning strikes (i.e. strikes between or within clouds or to nearby objects which produce electromagnetic fields) that induce voltages/currents on the conductors outside and/or inside a building. 
• Lightning ground current flows resulting from nearby direct-to-earth discharges coupling into the common ground paths of the grounding system of the installation. 
  
  

The rapid change of voltages and flows of current which can occur as a result of the operation of a lightning protection device can induce electromagnetic disturbances into adjacent equipment. 

Target of the IEC 61000-4-5 is to provide a model to simulate these surges and then to be able to check if the equipment is able to survive them.

AMETEK CTS solutions 

EM TEST	compact NX5 compact NX7 TSS 500N VCS 500N10T
Teseq	NSG 3040A  NSG 3060A  NSG 3150

IEC 61000-4-12  Ring wave
The Ring wave is an oscillatory transient, induced in low-voltage cables due to the switching of electrical networks and reactive loads, faults and insulation breakdown of power supply circuits or lightning. It is, in fact, the most diffused phenomenon occurring in power supply networks, as well as in control and signal lines. Another cause is lightning which itself is characterized by a unidirectional waveform.

The phenomenon which is created by the above mentioned effects is an oscillatory transient or a Ring wave. A Ring wave with a defined 0,5 µs rise time and 100 kHz oscillation frequency has been determined to be typical and is widely used for testing products.

AMETEK CTS solutions 

EM TEST	compact NX7 OCS 500N6 OCS 500N6F
Teseq	NSG 3060A

IEC 61000-4-18  Slow and Fast  Damped Oscillatory Wave
This test is for equipment when subjected to damped oscillatory wave on supply, signal, control and ground. The damped oscillatory wave phenomena are divided into two parts. The first part is referred to as the slow damped oscillation frequencies between 100 kHz to 1 MHz. The second part is referred to as the fast damped oscillatory wave, includes frequencies of 3, 10 and 30 MHz.

AMETEK CTS solutions 

EM TEST	OCS 500N6

IEC 61000-4-11 / -4-34  Power Fail (AC)
Electrical and electronic equipment can be affected by voltage dips, short interruptions or voltage variations of the supply. Voltage dips and short interruptions occur due to faults in a network or in installations by sudden changes of large loads. In certain cases, two or more consecutive dips or interruptions can occur. Voltage variations are caused by continuously varying loads connected to the network. 

AMETEK CTS solutions  - 61000-4-11 "Power Fail - < 16 A"

EM TEST	compact NX5 compact NX7 PFS 503N
Teseq	NSG 3040A NSG 3060A

AMETEK CTS solutions  - 61000-4-34 "Power Fail - > 16 A" 

EM TEST

PFS 503N

EM TEST

PFS 503N

IEC 61000-4-29  Power Fail (DC)
The operation of electrical and electronic equipment can be affected by voltage dips, short interruptions or voltage variations of the supply. Voltage dips and short interruptions are mainly caused by faults in the DC distribution system or by sudden changes of large loads. Voltage variations are primarily caused by the switching of mechanical relays when changing from one source to another (e.g. from generator set to battery).

These automotive pulses occur regularly in the vehicle primarily due to switching on and off of various vehicle components from the starter motor to electrical and electronic systems.

There are both emissions and immunity tests required by the standards, of which there are many. The main standards like ISO 7637-2 and ISO 16750-2 define both how these pulses must be simulated and how they are measured and with what limits. The vehicle manufacturers who are ultimately responsible often take these requirements and expand or modify them.

For immunity testing according to ISO 7627-2, you need a transient generator that includes some kind of coupling network, a battery simulator and function generator.  ISO 16750-2 adds a suite of voltage simulations and a load dump test.

Many OEM requirements include ESD testing similar to ISO 10605, for which an NSG 438 or esd NX30 is highly recommended.

AMETEK CTS solutions

EM TEST	UCS 200N LD 200N AutoWave VDS 200Q esd NX30 Transient Emissions Set
Teseq	NSG 5500 LD 5505 PA 5840 NSG 438 AES 5501