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Product Groups

Automotive Electrical Disturbances
- Transient Immunity
  - RCB 200N1
  - NSG 5071
  - JT 5550
  - JT 5510
  - MT 5511
  - LD 5550
  - FLX 5510
  - NSG 5500
  - UCS 200N Family
  - LD 200N series
- Transient Emissions
  - AES 5501
  - Transient Emission Set
- Automotive Electrical Disturbances Accessories
  - CA ISO
  - CA BS 200N
  - CDN 500
  - ACC
Automotive Supply Voltage Variations
- Ripple Generators and Couplers
- Dips and Interrupts Generators and Modules
- LV 124 and LV 148 Systems and Components
- Arbitrary Waveform Generators
  - ARB 5500
  - AutoWave
- Accessories
  - CA LV124/LV148 Series
Automotive Battery Simulators
- Four-Quadrant Battery Simulators
  - VDS 200Q Series
  - PA 5840 & PA 5740 Family
- One- and Three-Quadrant Battery Simulators
  - VDS 200R Series
  - RDS 200N1
Electrostatic Discharge ESD
- 16.5 kV
  - NSG 435
  - dito
- 30 kV
- Accessories
  - MD 102A
  - CTR 2
Harmonics & Flicker
- Analyzers
  - DPA 500N
  - DPA 503N & AIF 503N
- Power Sources
- Flicker Impedances
  - DPA 503N & AIF 503N
Programmable AC/DC Power Sources
- Single Phase
- Three Phase
- Options & Accessories
  - C-BOX 10/100-1000
  - SPN 3-690-200
Dips, Interrupts & Variations
- Power Fail Simulators
  - PFS 503Nx.2 Series
  - PFS 503N Series
- Stepped Transformers
- Motor Variacs
Ring Wave / Damped Oscillatory
- Ringwave Generator
- Damped Oscillatory Wave
  - OCS 500N6 series
  - OCS 500N6F series
- Coupling Networks
  - CNV 504N5.1
  - CNV 508N4
Transient Generators (Surge, Burst)
- Compact Generator 5 kV
  - compact NX5 series
  - NSG 3040A models
- Compact Generator 7 kV
  - compact NX7 series
  - NSG 3060A models
- Burst Generator
- Surge Generator
- Telecom Surge
- Voltage Surge (1.2/50 us)
- Current Surge (8/20 us)
  - CSS 500N2 series
- Coupling Networks - Data Lines
- Coupling Networks - Power Lines
- Transient Accessories
Magnetic Fields
- Magnetic Fields for Automotive Applications
  - AMP 200N
- Field Generator
- Magnetic Field Antennas
Amplifiers - Solid State
- < 1 GHz
- < 6 GHz - Single Band
- < 6GHz - Dual Band
Amplifiers - CW TWT
- < 4 GHz
  - TWT2G4G Series
- < 8 GHz
  - TWT2G7G Series
  - TWT4G8G Series
- < 12 GHz
  - TWT6G12G Series
  - TWT8G12G Series
- < 18 GHz
  - TWT6G18G Series
  - TWT8G18G Series
Amplifiers - Pulsed TWT
- < 4 GHz
  - PTWT2G4G Series
- < 8 GHz
  - PTWT4G8G Series
- < 12 GHz
  - PTWT8G12G Series
- < 18 GHz
Amplifiers - Millimeter TWT Amplifiers
- < 26 GHz
- < 40 GHz
RF Immunity Test Systems
- High Frequency Generators
- Low Frequency Generators
  - CWS 500N3
  - NSG 4060A
- Broadband Noise Generators
  - NSG 4031
- Software
  - CIS
RF Coupling Networks/ LISN
- CDN| EM TEST | Teseq
- CDND
- CDNE
- CN
- CT
  - CT 419-5
- LISN or AMN | EM TEST | Teseq
- ISN or AAN | EM TEST | Teseq
RF Probes and Clamps
- Absorbing Clamps / Ferrite Tubes
  - MBT 2 ( f.MDS21)
  - FT 801
  - CAL CMAD20A
  - CMAD 10
  - CAL KEMZ
  - CMAD 20B
  - MDS 21B
  - KEMA 801B
- EM Clamps | EM TEST | Teseq
- Current Injection Probes
  - CIP 9136A
  - PCJ 9201B
  - PCJ 9202
  - CIP 9138
- Current Sensing Probes
  - MD 4070
  - CSP 9160A
- Capacitive Voltage Probe
  - CVP 2200A
RF System Components and Accessories
- Power Amplifiers | EM Test | Teseq
- Preamplifiers | EM Test | Teseq
  - LNA 6901
  - LNA 6900
- Power Meters | EM Test | Teseq
  - PMR 6006
  - PMR 6003
- RF Switches | EM Test | Teseq
  - SW 4070
  - SW 6012
  - RFB 6000
- Attenuators | EM Test | Teseq
  - ATN 6 Series
- Directional Couplers | EM Test | Teseq
  - DCP 0100B
- Reference Sources | EM Test | Teseq
- Cables / Kits / Misc | EM Test | Teseq
  - BAL 4070
  - CAS BAL4070
  - CTP 6099
  - LE 4031
  - BTP 6020
  - ITF
  - RAD 6000
- Software
  - CIS
GTEM / TEM Cells / Striplines / Reverberation Chambers
- GTEM Cells
  - GTEM 250
  - GTEM 500
  - GTEM 750
  - GTEM 1000
  - GTEM 1250
  - GTEM 1500
  - GTEM 1750
  - GTEM 2000
  - MPH
  - MPC
- Predefined GTEM Systems
  - GTEM Immunity Test Systems
- TEM Cells
  - D-TEM
- Reverberation Chambers / Stirrers
- Striplines
  - SL 50
  - SL 150
  - TPL 3000
  - SL 90
Antennas
- Bilog
  - CBL 6141B
  - CBL 6143A
  - CBL 6111D
  - CBL 6112D
  - BTP 6020
- Horn
  - TEM Horn
  - TEM Probe
- Loop
  - HLA 6121
  - CTP 6099
  - LAS 6100
  - LAS 6120

Cables / Kits / Misc | EM Test | Teseq

RF System Components and Accessories | EM Test | Teseq

Assortment of different products and accessories needed during EMC testing.

BAL 4070

The standard ISO / DTS 7637-4 specifies tests for pulsed sinusoidal disturbances. Teseq offers with BAL 4070 the balun transformer, which is required to couple the disturbance signal over the artificial networks to the device under test. The optionally available CAS BAL4070 allows the verification / calibration of BAL 4070. The versions BAL 4070-10 and BAL 4070-50 have been developed for tests according to MBN 10284‑3, where tests are performed between 150 kHz and 50 MHz.
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CAS BAL4070

The product CAS BAL4070 is made for function tests, verification measurements and / or calibration on BAL 4070. Measuring parameter is the coupling attenuation S21. The CAS BAL4070 contains the measuring balun MB 100-20, adapter AD 1 mm / BNC and two RF cables LE 265.
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CTP 6099

EMC Antenna Tripod. The CTP 6099 tripod is ideal for outdoor applications and use on soft ground. It has been designed for the loop antenna HLA 6120 and can be used with the optionally available adapters for other antennas
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LE 4031

The LE 4031 provides the RF cables, attenuators, baluns and termination as needed for the level setting procedure in accordance with the standard IEC / EN 61000-4-31.
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BTP 6020

EMC Antenna Tripod
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ITF

The Isolation Transformer (ITF) provides the 60 dB decoupling as required in IEC / EN 61000-4-16. The ITF is placed between coupling network and mains. It can be used for a mains frequency in the range 47 to 63 Hz. Two types are available, ITF 14A for 14.4 Amps and ITF 22 for 21.7 Amps.
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RAD 6000

Radiation source for using the modelled long wire antenna method for CISPR 25 Annex J
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