DROPOUT TESTING
“ARE YOU DOING IT WRONG?”
The challenge
Different test setups and confusion about the intent of the standard can result in different results and behavior of the device under test during the simulation.
These types of testing are usually called ‘dips and drops’ testing. A dip is a short dip in the voltage to something higher than 0V, where a drop is when the supply voltage to the DUT (device under test) drops to zero for a defined period. There is some confusion for users about this type of testing, for which there are a large number of standards from OEM standards to international regulations like ISO 16750-2. This comes from two or three different ways of performing the testing, but also because the standards writer doesn’t make their intent clear, or the user is confused about how best to perform the test according to the stated intent of the standard.
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The document is designed to accompany a video recording of a live webinar presented by Tim Horacek.
WATCH THE WEBINAR PRESENTATION