Your browser is out of date. The site is optimized for IE 9 (not compatibility mode) and above, Chrome 29, Firefox 23 and Safari 6.0.
Skip to content
International - English
This site in other countries/regions:
Select Country to see regional site for Ametek.com
中文
日本語
International
Toggle navigation
PRODUCTS
Product Groups
Automotive Electrical Disturbances
Transient Immunity
Transient Emissions
Automotive Electrical Disturbances Accessories
Automotive Supply Voltage Variations
Ripple Generators and Couplers
Dips and Interrupts Generators and Modules
LV 124 and LV 148 Systems and Components
Arbitrary Waveform Generators
Accessories
Automotive Battery Simulators
Four-Quadrant Battery Simulators
One- and Three-Quadrant Battery Simulators
Electrostatic Discharge ESD
16.5 kV
30 kV
Accessories
Harmonics & Flicker
Analyzers
Power Sources
Flicker Impedances
Programmable AC/DC Power Sources
Single Phase
Three Phase
Options & Accessories
Dips, Interrupts & Variations
Power Fail Simulators
Stepped Transformers
Motor Variacs
Ring Wave / Damped Oscillatory
Ringwave Generator
Damped Oscillatory Wave
Coupling Networks
Transient Generators (Surge, Burst)
Compact Generator 5 kV
Compact Generator 7 kV
Burst Generator
Surge Generator
Telecom Surge
Voltage Surge (1.2/50 us)
Current Surge (8/20 us)
Coupling Networks - Data Lines
Coupling Networks - Power Lines
Transient Accessories
Magnetic Fields
Magnetic Fields for Automotive Applications
Field Generator
Magnetic Field Antennas
Amplifiers - Solid State
< 1 GHz
< 6 GHz - Single Band
< 6 GHz - Dual Band
< 8GHz - Single Band
Amplifiers - CW TWT
< 4 GHz
< 8 GHz
< 12 GHz
< 18 GHz
Amplifiers - Pulsed TWT
< 4 GHz
< 8 GHz
< 12 GHz
< 18 GHz
Amplifiers - Millimeter TWT Amplifiers
< 26 GHz
< 40 GHz
RF Immunity Test Systems
High Frequency Generators
Low Frequency Generators
Broadband Noise Generators
Software
RF CDND-Differential Mode
CDND IEC/EN 61000-4-31
CDND IEC/EN 61000-4-19
Accessories
RF CDN-Common Mode
CDN AF Series From 10 kHz
CDN AF Series From 150kHz
CDN AF CAN Series
CDN M Series From 10 kHz
CDN M Series From 150 kHz
CDN S Series
CDN T Series
RF CN and Transformer
CN
Transformer
RF CDN-Emission Testing
CDNE Series
Accessories
RF HV-AN/ISN
HV-AN Series
ISN Series
ISN Accessories
RF Probes and Clamps
Absorbing Clamps / Ferrite Tubes
EM Clamps
Current Injection Probes
Current Sensing Probes
Capacitive Voltage Probe
RF System Components and Accessories
Power Amplifiers
Preamplifiers
Power Meters
RF Switches
Attenuators
Directional Couplers
Cables / Kits / Misc
Software
GTEM / TEM Cells / Striplines / Reverberation Chambers
GTEM Cells
Predefined GTEM Systems
TEM Cells
Reverberation Chambers / Stirrers
Striplines
Antennas
Bilog
Horn
Loop
Product Selector
Solutions and applications
RF Immunity
Transient Pulse Immunity
Broadband Power Amplifiers
Safety Instructions
STANDARDS
Automotive
Basic Standards
INDUSTRIES
Automotive
Aerospace & Defense
Electrical/Electronic Products
Telecommunications
SUPPORT
Overview
Calibration
Upgrade and repair
Seminars & Training
Software | Firmware | Updates
Service & Support Request
Bergkamen service center
ABOUT US
Brands
Events
News
EHS
Quality
Supplier resources
KNOW-HOW
EV Know-How
CTS 23 video library
How-to video series
Video Channel
EMC Best Practice Webinars
Technical Papers
EMC On-Air Podcast
Glossary of terms | EMC Test Equipment
IEC Transient pulse immunity
CONTACT US
Where to Buy
Contact Us
Global Sales and Service Offices
GET A QUOTE
KNOWLEDGE CENTER
Application Notes
Resources
FAQs
Amplifier FAQs
Designing an EMC Test System FAQs
Using an EMC Test System FAQs
emcware FAQs
Multi-Tone Systems FAQs
Catalogs and brochures
RF & EMC Product Catalog
Book of Knowledge
Posters
Mathematical Tools of the Trade
RF and Conducted Immunity
RF and EMC Formulas and Charts
Webinars
Videos
News
Rethinking solid-state
Enhanced S6G18C Series
IEEE IMS 2025
The Orange Book of Knowledge Ed.10
Introducing the new AR08M4 and AR4i8 series
AR RF-Microwave Instrumentation Joins the AMETEK CTS Family
Strategic Service Support Update for AR Amplifiers Customers in Europe
AMETEK CTS
»
AR RF/Microwave Instrumentation
»
KNOWLEDGE CENTER
»
Webinars
»
Webinars
Back to the Basics with AR: EMC 101
In the beginning, there was RF ...and then there was RF interference.
Testing the Life Expectancy of RF Front-end Components (HTOL Systems and Burn-In Testing)
Wireless front-end components are potentially subjected to high-stress levels. Because of this, operational RF drive levels and currents exacerbate the potential for failure. Additionally, connection to an antenna permits to ingress of external energy. Manufacturing variance and defect can contribute to the possible life span. These aspects require specialized testing to capture both early failures and long-term wear-out. This presentation will consider the parameters and equipment necessary to accurately specify Mean Time to Failure (MTTF) and capture Early Failure Rate (EFR)
Back to the Basics with AR: Conducted and Radiated Emissions Basics
Test Equipment Selection: Knowing the Limits of Power, Frequency, and Everything In Between
Back to the Basics with AR: EMC Troubleshooting Radiated Emissions, Radiated Immunity and ESD on the Bench Top
Back to the Basics with AR: Intro to HTOL-Burn-In Testing
Back to the Basics with AR: The Purpose of Conducted and Radiated Immunity
5GIoT and EMC Testing
KEYNOTE – Disruptive Technologies and the Need for EMC Education
AR’s Predefined Radiated Immunity Test Systems
Successfully Performing an IEC 61000-4-3 Field Calibration
It’s Electric: Test Requirements for Electric Vehicles and How They’re Evolving
Automotive Multi-Tone Testing
AR Field Probes & Field Analyzers
AR MIL-STD-464 Systems
Critical Steps in Designing EMC Test Systems
AR’s Award-Winning Field Generating Systems
Improving EMC Test Lab Workflow
Fundamentals of Radiated Susceptibility Focusing on Requirements, Equipment, and Application
JOIN THE CONVERSATION
MacCMS
×